IEEE 1545-1999

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New IEEE Standard – Inactive-Withdrawn.Jan 2005: Administratively withdrawn. A language and file format for describing parametric test data is defined. Data types, dataformats, and file formats are included.

Product Details

Published:
11/15/1999
ISBN(s):
0738117757, 9780738117768
Number of Pages:
36
File Size:
1 file , 100 KB
Product Code(s):
STDWD94771