Fixed capacitors for use in electronic equipment — Part 13: Sectional specification — Fixed polypropylene film dielectric metal foil d.c. capacitors (Foreign Standard)
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/2009
Category: JIS
JIS B 9717-1:2011
Safety of machinery — Pressure-sensitive protective devices — Part 1: General principles for design and testing of pressure-sensitive mats and pressure-sensitive floors (Foreign Standard)
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/2011
JIS B 7726:2017
Rockwell hardness test — Verification and calibration of testing machines and indenters (Foreign Standard)
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/2017
JIS L 1922:2016
Textiles — Determination of antiviral activity of textile products (Foreign Standard)
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/2016
JIS K 0050:2011
General rules for chemical analysis (Foreign Standard)
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/2011
JIS K 2258-1:2009
Crude petroleum and petroleum products — Determination of vapour pressure — Part 1: Reid method (Foreign Standard)
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/2009
JIS K 3850-4:2000
Measuring method for airborne fibrous particles — Part 4: Indirect-transfer transmission electron microscopy method (FOREIGN STANDARD)
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/2000
JIS C 2116:2011
Methods of test for electrical insulating materials based on mica (Foreign Standard)
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/2011
JIS Q 22301:2013
Societal security — Business continuity management systems — Requirements (Foreign Standard)
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/2013
JIS K 3850-3:2000
Measuring method for airborne fibrous particles — Part 3: Indirect-transfer transmission electron microscopy method (FOREIGN STANDARD)
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/2000