Exposure to electric or magnetic fields in the low and intermediate frequency range – Methods for calculating the current density and internal electric field induced in the human body – Part 3-1: Exposure to electric fields – Analytical and 2D numerical models
standard by International Electrotechnical Commission, 05/23/2007
Category: IEC
IEC 63093-5 Ed. 1.0 en:2018
Ferrite cores – Guidelines on dimensions and the limits of surface irregularities – Part 5: EP-cores and associated parts for use in inductors and transformers
standard by International Electrotechnical Commission, 06/27/2018
IEC 62754 Ed. 1.0 b:2017
Computation of waveform parameter uncertainties
standard by International Electrotechnical Commission, 05/24/2017
IEC 62287-2 Ed. 1.0 en:2013
Maritime navigation and radiocommunication equipment and systems – Class B shipborne equipment of the automatic identification system (AIS) – Part 2: Self-organising time division multiple access (SOTDMA) techniques
standard by International Electrotechnical Commission, 03/18/2013
IEC 62488-1 Ed. 1.0 b:2012
Power line communication systems for power utility applications – Part 1: Planning of analogue and digital power line carrier systems operating over EHV/HV/MV electricity grids
standard by International Electrotechnical Commission, 11/29/2012
IEC 62208 Ed. 2.0 b:2011
Empty enclosures for low-voltage switchgear and controlgear assemblies – General requirements
standard by International Electrotechnical Commission, 08/19/2011
IEC 62752 Ed. 1.1 b:2018
In-cable control and protection device for mode 2 charging of electric road vehicles (IC-CPD) CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 09/13/2018
IEC 62486 Ed. 1.0 b:2010
Railway applications – Current collection systems – Technical criteria for the interaction between pantograph and overhead line (to achieve free access)
standard by International Electrotechnical Commission, 07/28/2010
IEC 62985 Ed. 1.0 en:2019
Methods for calculating size specific dose estimates (SSDE) on computed tomography
standard by International Electrotechnical Commission, 09/13/2019
IEC 62878-1-1 Ed. 1.0 b:2015
Device embedded substrate – Part 1-1: Generic specification – Test methods
standard by International Electrotechnical Commission, 05/20/2015