Reliability of fibre optic interconnecting devices and passive components – Part 2: Quantitative assessment of reliability based on accelerated ageing test – Temperature and humidity; steady state
standard by International Electrotechnical Commission, 03/07/2001
Category: IEC
IEC 62906-5-4 Ed. 1.0 en:2018
Laser display devices – Part 5-4: Optical measuring methods of colour speckle
standard by International Electrotechnical Commission, 01/09/2018
IEC 62153-4-16 Ed. 1.0 en:2016
Metallic communication cable test methods – Part 4-16: Electromagnetic compatibility (EMC) – Extension of the frequency range to higher frequencies for transfer impedance and to lower frequencies for screening attenuation measurements using the triaxial set-up
standard by International Electrotechnical Commission, 10/26/2016
IEC 62435-2 Ed. 1.0 b:2017
Electronic components – Long-term storage of electronic semiconductor devices – Part 2: Deterioration mechanisms
standard by International Electrotechnical Commission, 01/24/2017
IEC 62127-2 Ed. 1.2 b:2017
Ultrasonics – Hydrophones – Part 2: Calibration for ultrasonic fields up to 40 MHz CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 03/22/2017
IEC 62347 Ed. 1.0 b:2006
Guidance on system dependability specifications
standard by International Electrotechnical Commission, 11/28/2006
IEC 62337 Ed. 1.0 en:2006
Commissioning of electrical, instrumentation and control systems in the process industry – Specific phases and milestones
standard by International Electrotechnical Commission, 11/08/2006
IEC 62053-23 Ed. 1.0 b:2003
Electricity metering equipment (a.c.) – Particular requirements – Part 23: Static meters for reactive energy (classes 2 and 3)
standard by International Electrotechnical Commission, 01/29/2003
IEC 62541-8 Ed. 2.0 b:2015
OPC Unified Architecture – Part 8: Data Access
standard by International Electrotechnical Commission, 03/25/2015
IEC 62356-2 Ed. 1.0 b:2003
Video recording – 12,65 mm Type D-11 format – Part 2: Picture compression and data stream
standard by International Electrotechnical Commission, 11/07/2003