Category: IEC

Semiconductor devices – Micro-electromechanical devices – Part 11: Test method for coefficients of linear thermal expansion of free-standing materials for micro-electromechanical systems
standard by International Electrotechnical Commission, 07/17/2013

Photovoltaic system performance – Part 1: Monitoring
standard by International Electrotechnical Commission, 03/03/2017

Surface mounted piezoelectric devices for frequency control and selection – Standard outlines and terminal lead connections – Part2: Ceramic enclosures CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 03/14/2014

Fibre optic connector interfaces – Part 12: Type FS connector family
standard by International Electrotechnical Commission, 08/20/1999

Software dependability through the software life-cycle processes- Application guide
standard by International Electrotechnical Commission, 06/30/2000

Medical electrical equipment – Characteristics of digital X-ray imaging devices – Part 1-3: Determination of the detective quantum efficiency – Detectors used in dynamic imaging
standard by International Electrotechnical Commission, 06/11/2008

Industrial-process measurement and control – Data structures and elements in process equipment catalogues – Part 14: Lists of properties (LOP) for temperature measuring equipment for electronic data exchange
standard by International Electrotechnical Commission, 04/26/2016

Fibre optic interconnecting devices and passive components – Performance standard – Part 042-2: Plug-pigtail-style and plug-receptacle-style of OTDR reflecting devices for category C – Controlled environments
standard by International Electrotechnical Commission, 08/21/2014

Electrostatics – Part 5-2: Protection of electronic devices from electrostatic phenomena – User guide
standard by International Electrotechnical Commission, 08/14/2007

Electroacoustics – Sound level meters – Part 3: Periodic tests
standard by International Electrotechnical Commission, 09/30/2013