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Specifies a method to measure the conducted electromagnetic emission of integrated circuits by direct RF current measurement with a 1 ohm resistive probe and RF voltage measurement using a 150 ohm coupling network. These methods guarantee a high degree of repeatability and correlation of measurements.
Product Details
- Edition:
- 1.0
- Published:
- 04/30/2002
- Number of Pages:
- 57
- File Size:
- 1 file , 2.7 MB
- Part of:
- IEC 61967-4 Ed. 1.1 b:2006